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Engineering | DEfECT Lab

Sinton Lifetime Tester WCT-120TS

SintonSinton lifetime tester is a powerful tool for characterization and optimization of silicon material, including dopant diffusion and passivation quality. It uses an eddy-current conductance sensor and a filtered xenon flash lamp to measure carrier lifetime. Measurements can be taken using either Quasi-Steady-State-Photoconductance (QSSPC) method or Transient PhotoConductance Decay (Transient PCD). The temperature-controlled stage adds the capability to measure the carrier recombination lifetime of silicon wafers at temperatures ranging from 25°C to 230°C.